Pre-Grant Publication Number: 20110161738
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Prior Art Detail
Summary / Description
| Summary / Description | The eye diagram analyzer constructs both conventional eye diagrams and special eyeline diagrams to perform extinction ratio and mask tests on digital transmitters. It also makes a number of diagnostic measurements to determine if such factors as waveform distortion, intersymbol interference, or noise are limiting the bit error ratio of a transmission system. |
Basic Information
| Type of Prior Art | Online Publication |
| URL | http://www.hpl.hp.com/hpjournal... |
| Author/Creator | Christopher M. Miller |
| Title | High Speed Digital Transmitter Characterization Using Eye Diagram Analysis |
| Publication Date | August 31, 1994 |
| Publisher | Hewlett-Packard Journal |
| Directions to Document Location | Most relevant info is FIG. 1 where it shows the eye diagram analyzer with an error detector and pattern generator. Also page 35 and 36 explain how the eye diagram crossing level is adjusted. |
| Additional Information | |
Notes / To Do
| Notes | |
Excerpt
Excerpt page 35: *****
*****
Eye Diagram Measurements
A number of parametric measurements are often performed on eye diagrams to determine their quality. Some of the more prevalent measurements include eye opening height, eye opening width, amplitude of the crossing level, jitter at the transition point, and the rise and fall times of the bit transitions.
pages 35-36:
An algorithm that recursively adjusts the limits for subsequent evaluation of the histogram data converges on the most prevalent logical 1 and 0 levels... the new mean and standard deviation (sigma) for the 1 level are then determined. This process iterates several times until the sigma becomes small and the mean converges on the most prevalent 1 level. The determination of the most prevalent 0 level is based on the same algorithm... The other eye parameter measurements are also based on histograms. |
Relevance
Claims
1
Relevance
The prior art is relevant, because it consists of an eye diagram analyzer that looks at parameters of the eye diagram. One of these parameters is the "eye diagram crossing level amplitude" which is the same as the transmitter parameter in the patent application referred to as the "eye diagram crossing point." The prior art than adjusts this parameter and continually iterates through this until the bit error rate is minimized just like in the patent application. The error signal analyzing unit is the error detector in FIG 1 of the prior art, and the step length adjustment unit is the eye diagram analyzer which performs these iterations.
The prior art is relevant, because it consists of an eye diagram analyzer that looks at parameters of the eye diagram. One of these parameters is the "eye diagram crossing level amplitude" which is the same as the transmitter parameter in the patent application referred to as the "eye diagram crossing point." The prior art than adjusts this parameter and continually iterates through this until the bit error rate is minimized just like in the patent application. The error signal analyzing unit is the error detector in FIG 1 of the prior art, and the step length adjustment unit is the eye diagram analyzer which performs these iterations.
Claim Chart
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